STM 1, Nanosurf

The Nanosurf Scanning Tunneling Microscope is an easy to use instrument with which you can achieve down to atomic resolution of the surface of conducting samples, in air. It is a probe microscope that measures tunneling currents between the sample and the tip. It is mainly used with clean Au and graphite samples in student labs.

Sample Specification:

Only conducting samples. Maximum sample diameter 10 mm, but no limitations in thickness. The maximum scan range of this STM is 500 nm, and 200 nm in Z-direction.

Contact:

Verner Håkonsen

Senior Engineer

NTNU NanoLab

Engineer responsible for characterization at NTNU NanoLab together with Jakob Vinje. Also responsible for the XPS/AES lab. Has experience in chemical methods, such as nanoparticles synthesis. Has been responsible for thin film deposition in the past.

Performs operator service on SEM/STEM, FIB, AFM, profilometers and XPS.

+47 92057253

verner.hakonsen@ntnu.no