Model: M-2000V
Manufacturer: J. A. Woollam Co., Inc
Area: Cleanroom

Spectroscopic ellipsometry measures the change in polarization of light as it interacts with a layered material, allowing for the determination of layer thickness and optical constants by analysing the resulting ellipsometric parameters.

Wavelength range: 370-1000 nm

Angles: 65, 70, 75 degrees

Auto-Angle ESM-300 Base