
Technology Description: |
The Micro and Nanotechnology Laboratory at the University of Oslo (UiO MiNaLab) is equipped with a Shimadzu SolidSpec-3700 DUV with an integrating sphere. It is suitable for transmission, reflection, and scattering measurements of thin films. The sample size should be 5 mm × 5 mm or larger. The system is a double beam spectrometer, using a reference beam to avoid inaccuracies in the measurement from variable light intensity. |
Measurements: |
Total light transmission. Specular and diffuse reflection. Performed at a 5º angle. Diffuse reflection. |
Technical Information: |
Wavelength range: 185 – 2500 nm. Spectral resolution: 0.1 nm. Data collection intervals between 0.01 – 5 nm (1 nm commonly used). Light sources:
Double beam instrument: Reference beam corrects for fluctuations in, e.g., the light source intensity or detector response, over time. Detectors to cover the whole range from UV to NIR in the same scan:
Automatic dark correction: spectrometer automatically corrects measurements in the NIR to account for blackbody radiation from the instrument. |
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