The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems to provide unparalleled imaging and analytical performance. Designed with intuitive logic, the new user-friendly GUI provides comprehensive image observation and display functions. Engineered for a wide range of applications including biological specimens and advanced materials, the SU3500 is sure to be the workhorse microscope in any laboratory.
All new electron optics design with best-in-class image sharpness. 7 nm SE Image Resolution at 3 kV, 10 nm BSE Image resolution at 5 kV.
Wide-screen GUI and fast auto image optimization functions (7 seconds) via "delegation" technology.
Image surface information at low vacuum and low accelerating voltages.
Point and click for seamless, real-time "3D" image observation.
New Gun Bias System and Image Signal Processing allows quick and easy focus adjustment and astigmatism correction
High speed Automatic Focus Control (AFC) and Auto Brightness & Contrast Control (ABCC) function enable faster and optimized image observation
Accelearing voltages 0,3 to 30kV
Magnification 5 to 300,000 X
Maximum Specimen size 200mm diameter
Maximum Height 80mm