Model: Dektak 150
Manufacturer: Veeco
Area: Characterisation

A profilometer is used to measure surface profiles to determine the roughness of surfaces. The Dektak 150 is a contact stylus profilometer. The diamond tip stylus is run over a sample surface and records height differences which is sent to a computer.

Materials allowed: everything which is not considered as contaminating within NanoLab rules, sample size can’t exceed 150 mm in diameter and 90 mm in height.

  • Scan length range: 55 mm
  • Vertical range: 524 µm
  • Vertical resolution: 1 Å maximum (at 6.55 µm range)
  • 12.5 µm diamond tip stylus

Contact:

Verner Håkonsen

Senior Engineer

NTNU NanoLab

Responsible for Characterization at NTNU NanoLab. Tool-responsible on SEM/STEM, FIB, AFM, profilometers, wire bonder and coaters for SEM prep. Has also experience in chemical methods, such as nanoparticles synthesis.

+47 92057253
verner.hakonsen@ntnu.no