Technologies
Bonding and packaging
Characterisation
Chemical methods
Dry etch
Lithography
Sample preparation
Thermal processes
Thin film deposition
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NTNU NanoLab
UiO MiNaLab
USN MST-Lab
SINTEF MiNaLab
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About Norfab
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LIMS
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Technologies
Bonding and packaging
Characterisation
Chemical methods
Dry etch
Lithography
Sample preparation
Thermal processes
Thin film deposition
Labs
NTNU NanoLab
UiO MiNaLab
USN MST-Lab
SINTEF MiNaLab
Highlights
Access & Pricing
About
About Norfab
Contact us
Employees
LIMS
NTNU
USN
UiO
SINTEF MiNaLab
MENU
Home
»
Technologies
»
Characterisation
Impedance measurement
Model:
ZVL3
Manufacturer:
R&S
Area:
G1-30 Bioelectronics
NTNU NanoLab
UiO MiNaLab
USN MST-Lab
SINTEF MiNaLab
