Model: AlphaSE
Manufacturer: Woolam
Area: MiNaLab Clean Room

Material Class:

 Transparent solids

Technology Description:

 Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters and is related to a variety of sample properties. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a nanometers to several micrometers.

Technical Information:

 Type: Woolam Alpha SE.

Spectral range: 380 – 900 nm.

Angle of incidence: 65º, 70º, 75º, or 90º.

Data accousition rates: 3 sec (Fast mode), 10 sec (Standard mode), 30 sec (High precision mode).

Beam diameter: ~3mm.

Contact:

Vegard Rønning

Senior Engineer

UiO MiNaLab

Background In material science and nanotechnology from UiO.
Experience with design and operation of vacuum and cryogenic systems for electrical and optical characterization. 3D modeling and CAD.
Responsible for the laser cutter, atomic layer deposition and 3D printer at UiO MiNaLab.

+47 228 52 840 / +47 473 74 173
Vegard.ronning@smn.uio.no