Responsible for Characterization at NTNU NanoLab. Tool-responsible on SEM/STEM, FIB, AFM, profilometers, wire bonder and coaters for SEM prep. Has also experience in chemical methods, such as nanoparticles synthesis.
Model: Zeiss AxoScope A1 for Reflected light BF- DIC/POL
Manufacturer: Carl Zeiss
Area: Characterisation
There are two differential interference contrast microscopes in the cleanroom; one in the ISO7-area and one in the ISO 5+6-area. They both have colour CCD-cameras (3.3 megapixel) and are intended for general use within material science.
Contact:
Verner Håkonsen
Senior Engineer
NTNU NanoLab
Responsible for Characterization at NTNU NanoLab. Tool-responsible on SEM/STEM, FIB, AFM, profilometers, wire bonder and coaters for SEM prep. Has also experience in chemical methods, such as nanoparticles synthesis.