Model: SPARC
Manufacturer: Delmic
Area: MiNaLab SEM-room

This is the cathodoluminescence extenstion to the JEOL IT-300SEM at UiO MiNaLab. The instrument permits measurements in UV-Vis (CCD detector) and IR (InGaAs) spectral ranges. Additionally, angle-resolved data can be collected. 500 nm and 700 nm longpass filters installed, along with a number of band-pass filters. Separate gratings for UV-Vis and IR measurements. Separate "optics boxes" for UV-Vis and IR measurements. Probe current detector for measurement of electron beam current.


Capability for applying bias to sample during CL measurement is under development.