Model: 208 Carbon
Manufacturer: Cressington
Area: Characterisation

This carbon coater is used to produce extremely thin carbon layers on non-conducting samples. Suitable to reduce charging for S(T)EM imaging and EDX-analysis. Coating thickness is controlled by a thickness controller.

Sample Specifications:    

5” wafers are the maximum size that will fit in the chamber.


Verner Håkonsen

Senior Engineer

NTNU NanoLab

Engineer responsible for characterization at NTNU NanoLab together with Jakob Vinje. Also responsible for the XPS/AES lab. Has experience in chemical methods, such as nanoparticles synthesis. Has been responsible for thin film deposition in the past.

Performs operator service on SEM/STEM, FIB, AFM, profilometers and XPS.

+47 92057253