Carbon Coater for SEM Sample Prep.

This carbon coater is used to produce extremely thin carbon layers on non-conducting samples. Suitable to reduce charging for S(T)EM imaging and EDX-analysis. Coating thickness is controlled by a thickness controller.

Sample Specifications:    

5” wafers are the maximum size that will fit in the chamber.

Contact:

Verner Håkonsen

Senior Engineer

NTNU NanoLab

Responsible for Characterization at NTNU NanoLab. Tool-responsible on SEM/STEM, FIB, AFM, profilometers, wire bonder and coaters for SEM prep. Has also experience in chemical methods, such as nanoparticles synthesis.

+47 92057253

verner.hakonsen@ntnu.no