Carbon Coater for SEM Sample Prep.

This carbon coater is used to produce extremely thin carbon layers on non-conducting samples. Suitable to reduce charging for S(T)EM imaging and EDX-analysis. Coating thickness is controlled by a thickness controller.

Sample Specifications:    

5” wafers are the maximum size that will fit in the chamber.

Contact:

Aleksander Mosberg

Senior Engineer

NTNU NanoLab

Jointly responsible for characterization at NTNU NanoLab, with emphasis on FIB and SEM.

+47 90779882

aleksander.b.mosberg@ntnu.no